Air sampling order form, crystalline silica analysis, Apr 2003

NYC 9/11 Public Portal Document

-eA'R, 15. 20 311 : 1 1P,M18568';L;; ENIVIRO lE T•-'L EMSL NC, 6144 P. 2. @1

EMSL AnalyLaL, Inc, 107,1,tAJdoa Ave,, tmnt NJ ee109

Order YD;04o0305286 Attu: A cw/ M-N, Xhan • Bnvlroruxteatal Consultants, Inc. Custcmcr ID: ILCC-50 20 Park ,Ave South, Suite 100..1 Customer P0: N York, NY 10003 bate Received, 04/05/03 12:23 AM Fax: 21 •420.8092 Project: El SCiN • WARKEN y1 P.VIC$ C$IVT$R - 040305286 Repast Date: 04 4/03 DI??ROfl BMSI, Pro~t 1.0: Date r nwlyze ; 04/14/03

Silica, C lystalitne Analysis Performed X-Ray Diffraction (XRD) NIOSH Method 7500, Issue 3,1/15/98

.Raapfrabls lhrat Airborne 5il~ca Sample ID Sample Sample Silica I Silica % dcn+.~ficatioh Particle Volume Weight Analytical Cote. Weight COnC. ID St11ca Seneitivity t) (mg) (nfmj) I (Mg) (mod) i36g7 lZ t,R 9otJT!i Quurtz 408 !A K0.0045 <0.0110 i I1TJ FLR N!A 0.0110 MB13687-2 J DINNFNG uatwtz 408 <0.002 N/A 0.0090 MD13687..3 Ioib LADINING 0.0221 NIA 0,0110 tta 408 0.i 01 1.4730 M1313687-4 9 0.0080 0.G19 1.3 0,0110 RDINING uttrt: 408 0,014 0.0343 0.0090 0,0221 64.3 0,0110 8TH FJLR M$I3687S DrMNINo uartz 408 <0.001 N/A <0A045 <0.0110 NIA MB13687-6 7 FLR A Q tiettR 408 0.0110 MD 13687-1 0,010 0.0245 <0.0045 :0.0110 45.0 0.0110 5 P'LKDININCt uartz 08 0,090 0.2205 <0.0045 <0,01.i0 5.0 1 136 7•A 5'!' PPLR IN NINO aartZ. 0,0110 408 <0,002 /A <0.0045 <0.0110 4THFLR N!A 0.0110 !B13687.9 fr tTCEN uartz 408 0.115 0.2819 x0.0045 0.0110 1 3.9 0,0110

Disclaimer: 'itto ratery can only verify the concentration of silica on the inter and not obta1nod by non•t sexy porsonnel. J.ji t abaançpf a bulk dual the ,t at coriceutratton duo to data aamnje j1hertbe,.a c Th, , Of . - it ilic IcleLcan b od. Nice, the amount for each pha€e, if anticipated, will be 1/or tertiary peak data with compavoy;, to analyzed based on calibration ewes of known stardarda. it should be noted that sit saaa,1ca are meant only quant;$+ing siloca (or a mi,Yerel phase) which mesas less than the must first be identliiac from a bulk dust sample, u,„ ud value. The lowest reportable value i3 equivalent to the lowest reotoduclble Analytical Sensitivity that is calculated $oru the wt of specific mbaaal detectable by the ldsC *mi t_

Analyst Staten Siegel, CIII ,Gob Manager Or other approved Cignato,

4INA Accredited - Laboratory ID #100194 Page r of3

NYC-WTC 000100707