Air sampling order form, crystalline silica analysis, Apr 2003

NYC 9/11 Public Portal Document Er'l, 5. 2 3110: 12PM 9569 JLC E%Y: 1, 'MENLAL EMSL NC. 644 P. e2

EMSL Anal Inc. 101 ReddRd Ave., t, Na Oaipa

Order f0403O5286 Attu: 'ew/ M.N. ?Chan Customer ID: JLCC50 Envizoutnental CancultmuU, Inc. Cuetomcr P0: Park Ave SSouth, Suite 1001 Tate Rreeived: 04105,'03 1223 AM York, NY 10003 Fax: 2 420.6093 1 MSL 0rd : 040305296 Project, F, ION • WARKEN SERVICE CENTER. DETROIT, MI EMSL Protect ID: Report Data. 0 1/03 Date,Annlyzcd: 04/14!03

Silica, C Analysis Performed X-Ray Diffraction (XRD) NMOSH Method 7500, Issue 3,1115198 I 8espirahfa Dust 1 Airharns Salsa —~ Sample f Sample Silica ;dies % ' Analytical Sample YD lion Particle Volume Weight Ccnc. Weight Cone. Sllicss Sensltivity l.D (14 (mg) (mg/m3) (mg) (!m ) I (malrns).

10 j L KITCREN +~uanz L 4 08 _ 0.143 I 03505 <0.00451-.O.Q110 1 3.1 0.0110

Sr

Di~¢cla1mer: The lc oratory cat only verify the concen7Atlotl, of stUca or, the #4)ter and not tho final concentration due to data obtalued by non-la satory personnel. In the absence o[ a bulk dust sample, neither1he sstesi1Jcibrns et civets! tai 4a be fully dermin . , evvcc, fie amount for each phaac, if anticipated, will be analyzed bored on primary, a.condery,anWor tertiary peak data with comparison to cal1brat on curves of lmown etaodards. It Rhould be noted that air C

niuples are mear►tlbr only quantifying silloa (or a mineral phase) whicit 1n net first be iden ed $oat a bulk dust sample, "<" mews less than the jtatcd value, The lowest reportable value is equivalent to the Analytical Sensitivity that is calculated f}om the lowest r oducible mount of spevftc mineral detectable by the instrssrrxnt,

4nalp.cr Seephen Siegel, CI,ld-Lab Manager Or Other approved 3tgnatery

AIIIA Accredited -Laboratory ID #100194 Page2of3

NYC-WTC 000100708