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Silica XRD analysis results, 114 Liberty Street, Apr 2003

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Analytical report from EMSL detailing silica testing via X-ray diffraction for a project at 114 Liberty Street in April 2003.

NYC-WTC_000177534–000177536
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NYC 9/11 Public Portal Document 04/23/2003 11:31 18568589551 EMSL ANALYTICAL PAGE 03

EMSL Analytical, Inc, 107 Haddon Ave., Weatmoot, NJ 08108

Order ID=040305286 Attn: Andrew/ M.N. Khan Customer ID: JLCC50 JLC Environmental Consultants, Inc. Customer PO: 200 Park Ave South, Suite 1001 Date Received; 04/05/03 12:23 AM New York, NY 10003 Fax: 212-420-6092 EMSL Order; 040305286 Project: #03-2744/NYCDEP—114 Liberty ST EMSL Project ID: Report Date: 04/14/03 Date Analyzed; 04/14/03

Silica, Crystalline Analysis Performed X-Ray Diffraction (XRD) Modified NIOSH Method 7500, Issue 3,1/15/98

I Respirable Dust Airborne Silica J Sample Sample Silica Silica % Analytical Sample IP Identification Particle Volume Weight Cone. Weight Cone. Silica Sensitivity IP (L) (mg) (mg/m^) (mg) (mg/m’) (mg/ro’)

MB13687-3QC lOTHFLR PINING Quartz 408 0.601 1.4730 0.0070 0.0172 1.2 0.0110 STANDARD 0.03DQ Quartz N/A N/A N/A 0.025 N/A N/A N/A LAB BLANK Quartz 0 N/A N/A <0.0045 N/A N/A N/A

Notes:

1. Bulk sample not submitted with sample set. 2, Discernable field blank not submitted with sample set. 3. Results are not field blank corrected.

Disclaimer: The laboratory can only verily the concentration of silica on the filter and not the final concentration due to data obtained by non-laboratory personnel. In the absence of a bulk dust sample, neither the specific forms of crystalline silica nor the interfering species can be fully determined. Hence, the amount for each phase, if anticipated, will be analyzed based on primary, secondary, and/or tertiary peak data with comparison to calibration curves of known standards. It should be noted that air samples arc meant for only quantifying silica (or a mineral phase) which must first be identified from a bulk dust sample. means less than the stated value. The lowest reportable value is equivalent to the Analytical Sensitivity that is calculated from the lowest reproducible amount of specific mineral detectable by the instrument

Anant Sapaudra, Ph.D. Analyst Stephen Siegel, CIH- Lab Manager Or other approved signatory

AIHA Accredited - Laboratory ID itJ002 94 Page 3 of 3

CONFIDENTIAL, SUBJECTTO PROTECTIVE ORDER NO. 1, JAN. 2013 CITY_DEP_WORBY_CANNATA_SUBP_000008886

NYC-WTC_000177536

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NYC-WTC_000177536Source: NYC Law Department, mirrored locally

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