TRANSMISSION ELECTRON MICROSCOPY (TEM)
METHODOLOGY
technique, which focuses an electron beam
Transmission Electron Microscopy (TEM) is a beam
microscope column (under a vacuum). As the
onto a thin sample mounted in the resulting from varying density of the sample is
transmits through the sample, an image collected on either
samples for TEM analysis can be
projected onto a fluorescent screen. Air direct transfer
polycarbonate filters and are prepared using
mixed cellulose ester or preparation allows for the transfer of a carbon-
techniques (as per EPA regulations). Direct on to a
the filter material (with embedded fibers and particulates, etc.) right
coated replica of intermediate
Indirect transfer techniques require an
copper grid suitable for TEM analysis.
may break-up fiber bundles, resulting in an increased fiber amount.
step that
for the preparation and analysis of air samples by electron
Several methods exist
ry and non-mandatory
microscopy. Most signif;cant are the mandaAHERARegulations). These methods arettoobe
as appendices to 40 CFR 763, Subpart E ( projects.
air samples on school abatement
used for analysis of final clearance
represented by each fiber
analytical sensitivity is the airborne asbestos concentration collected the
The determined air
electron s
counted under the fivty be no
microscope~e{hod requires that the analytcal elns
proportion of the filter examined. This .
greater than 0.005 structures/cc.
register but
their sow indicators
Sampling pumps must be calibrated and
ank are' to be taken by removing the cap for +is
no more than 10 liters/min. Two (2) field is be crried with each samle set.
blank
more than 30 seconds. A sealed IedaThese samples are spbmtted tohthe
representative cassette is not to be opened in thef eriod f
for quality control purposes. The sampling houl be broPght tooa
laboratory liters of air. Thesamples darelate~
time to conform at least a volume of 1200
certified laboratory for the analysis.
NYC-WTC 000108363
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NYC-WTC_000108363Source: NYC Law Department, mirrored locally