Asbestos TEM micrograph data sheet, Oct 26 2001

NYC 9/11 Public Portal Document

ATC ASSOCIATES INC. TEM ANALYSIS LAP GROUP #: 5 5 10/26/0

Lab Sample No. 6^. Filcer Type MCE 25 mm lenc spl. No. 2 3 5 mrrC 2 Instrument: l.D EM lO.CRX Grid I.D. ZWEZ Dish No.

Screen Magnificat_cn 16 400X (GOI Area [',01124 inm~2 Comments Acc. Voltage 8 0 kV No. GO Lo be Analyzed 147 Scruct. . Gorsod. no 70 s'mx*2 ;

JiCL___ structure Structure Type Length I.D. of Structure N or EDS >0.5 um 1 (Nonaab. No Coord. No. F B C M > Sum Chrys. Amphibole Nonasb. Ambig./ND| Elements) < 5 um

^0.5

t i

Photo No. (from 1 in 5 aaliestofl- identify all atructurea using EDS Check diffraction for aabeatoa store all unrepeated spectra— containing samples) Grid acceptance:! structures up to TOa/Am (l»t 4) <S0X undiaaolvea TirUer^ overlapped oriolded StrucU - > 0.5um 8c > 5:. Aspect Ratio <10% particulate coverage >S0X coverage N's Not Observed (EDS spectrtim or diffraction pattern) at least 20 unfolded or overlapped grid squares Totals <5X holes or opaque areaa F Pcsitive diffraction pattern properties conforming BCM Sum to laboratory identification criteria observed. -Unuaed portion Of niter I I For ehrysoUie: d.Tanm spacini for (020) reflections. Q.t3nm ipacini for the layer Une repeat, streaking Chrysotile 'Avoided portion of (HQ) and (190) reHecUons. of niter Fsi* amphiboles: 0.93nm layer line repeat, and approx. Portion of filter (2mn) wide) 3.: ratio of non-t*tnned layer line spot spacing tc subject to examination Amphibole layer Une repeat distance (□.S3nn)).

EDS spectrum conforming to laboratory identification criteria observed. AMPHIBOLES Ambiguous P« Sir<le Fiber (1-3 InteraecUons = 1-3 flbera) Amosite B= Bundle (>3 fibers <1 fiber diameter apart) C= Chiater (>3 intersections) 25mm flllar Crocidolite Non-asbestos I stopping Rules: L—- Anthophyllite Us Matrix NSD= No Structures Detected >S0 s/G.O. er in lat 4 G.O. Tremolite Actinolite Non-ldentified L\DKTA\PR1VATE\H1KBC\CADDVEM3 8/22/98

CONFIDENTIAL, CITY_21MC100_003473412 SUBJECT TO PROTECTIVE ORDER NO. 2, SEPT. 2008

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