NYC 9/11 Public Portal Document
• 107lfaddon Avenue
EMSL Analytical,Inc.- 48NJ.
0008108
on
58-
West
9/26/0)
Attention: Chris Garber
URS
200 Orchard Ridge Drive
Suite 101
Gaithersburg, MD. 20878
Project-. 89- FUSPS035.02 / Peck Slip
Ref. Number: 360100275
Silica Analysis Performed by
X Ray Diffraction (XRD)
Method NIOSH 7500
Nuisance Dust Airborne Silica
Sample Sample Silica Silica % Analytical
Identification Particle ID Volume Weight Cooc. Weight Cone. Silica Sensitivity
Sample ID
m (mg/ms m (m!J m m
Quartz 1260 0.400 0.3175 <0.004 <0.0159 N/A 0.0159
PS-4F-$1 WestArea
Quartz 1260 0.140 0.1111 <0.004 <0.0159 N/A 0.0159
PS-4F-S2 East Area
Elevator Quartz 1260 0.010 0.0079 <0.004 <0.0159 N/A 0.0159
PS-4F-S3 <0.004 <0.0159 N/A 0.0159
PS-4F-&4 East Wall Quarm 1260 0270 02143
Quartz 1260 0.040 0.0317 <0.004 <0.0159 WA 0.0159
PS-4F-S5 North Wall
0.030 mg Quartz 0.032
Standard
Lab.Blank 0.000 mg Quartz 0.000
Bulk Analysis: Sample ID Sample Description Silica Forms Identified
Bulk Not Submitted
John Newton 26 September, 2001
Analyst Date of Analysis
Disclaimer: The laboratory Can only verify the eoncennation of silica on the filter and not the final concentration due to data obtained by
non-laboratory personnel In the absence ofa bulls dust sample, the specific form ofcrystalline clic, cam not be determined.
Hence, alpha-quartz. the most prevalent form of crystalline silica, will be assumed = Less than the stated value
the instrument
The lowest reportable value is equivalent to the Anatytinl Sensitivity which is calculated from the lowest reproducible concentration of silica detectable by
"A Accredited- Laboratory 1D #100192
NYC-WTC 000120343
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