None detected; concentration equivalent to analytical sensitivity aeaigned.
Thin tcot report :dated only to the epeciric items cited in the analysis.
laboratory is in compliance wath the duality
The analysis Mai carried out according to the approved TEM method. The
specified for the mcchod.
e ~-
This report must not ba used by the client to claim product endorsement by NVLAP or any agency oP the U.S. Government.
Analyzed by: Michael A. Gorycki, Ph.D.
Roman Paysakhov Director of Electron Microscopy
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NYC-WTC 000095295
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NYC-WTC_000095295Source: NYC Law Department, mirrored locally